Hi mgourley/Marshall,
Thanks for the attachment. Very interesting.
I liked the overall concept of the procedure. I guess this is an extract from another main document since no configurational settings/procedures are mentioned.
I assume a “sample” refers to the product, eg bread, with a test piece (wand) inserted so that the “active area” subsequently passes thru the central axis of the detector (assuming a symmetrical, horizontal, conveyor setup).
The logic for selection of (lower) critical limit appears based on choosing a value generating zero false negatives.
The Grid data, assuming a critical limit of 3mm for Fe indicates that the metal detector is also giving a (worst case) potential for approx. 50-60 % false positives (Bread/Hearth).
Is this a typical “trade-off” in the baking industry or does it indicate a need for a better metal detector.? (I recall another baking thread here where the limitation seemed to be due as much to the large sample dimension under test as maybe the intrinsic MD capabilities).
Might also be worth noting that the minimum size of metal which actually constitutes a significant hazard is by-passed by this approach. I wonder how the processor (or FDA) reconcile some limits with the FDA policy that the “passed” product could be, if unlabelled, a potential hazard for, say, the sensitive consumer population ? For example in Canada/(some)EC, AFAIK the minimum hazardous “size” is defined at 2mm (perhaps they have another work-around for processors ).